For wheat growers who normally top-dress nitrogen, the use of crop sensors could boost yields and reduce over or under application.

Today, Ag Leader Technology, Inc., a leader in the development of precision farming solutions, announced the release of the North American Wheat algorithm for OptRx, a crop sensor used for mapping, data collection and real-time variable rate nitrogen application. OptRx crop sensors determine a vegetative index reference value based on a plant with sufficient nitrogen and prescribe nitrogen rates based on plants’ crop vigor, taking into account field variability and crop conditions.

“Using OptRx for nitrogen application in wheat can help prevent yield loss commonly due to overapplication, especially in early growth stages,” says Roger Zielke, Product Manager. “Another major factor that OptRx can help account for is the variability in organic matter within fields. Variable rate nitrogen application with OptRx can compensate for these differences in organic matter, and our field trials have shown that it will help maximize profit potential by delivering the right amount of nitrogen to the right plant.”

OptRx can help improve nitrogen efficiency by scanning and measuring the impact of growing conditions on a plant, ultimately helping growers improve environmental stewardship and maximize profit potential. Nitrogen application on wheat can occur anytime between tillering and stem elongation, and any top-dress applicator can be used with OptRx for nitrogen application. Because OptRx uses a light-sensing technology that is not dependent on ambient light, OptRx can be used to apply nitrogen, whenever optimum conditions are available day or night. OptRx crop sensors are also available for nitrogen application in corn.